PROGRAMMABLE WAFER SAMPLER
AIS-X00

* Presents Wafers for 65 degree Inspection
* Extra cassette Location for Rejected Wafers; Side Cassette Loading
* Menu driven Programming for Operator and Maintenance
* Wafers Mapped & Monitored During Robotic Transfer
* Small Foot Print & Exhaust Ported

Description:
Rapid unload and presentation of wafers on 65 degrees tilt inspection. Keypad controlled providing both specific, and customized sequences. Unit equipped with extra cassette location for rejected wafers.

Options:
OCR System for Optical Character Reading
Stainless Steel Covers
RS232 Communications Port

Specifications:
Pressure: 55 to 65 PSI C.D.A. or N2
Power: 110-220 V.A.C. 50-60 hertz
Vacuum:22" Hg
Exhaust: 1.25" Port Dia.
Wafer Size 4" – 8"
Dimensions: (4-6") 12.5" W x 24" D x 24" H